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[IEEE 2006 International Conference on Power System Technology - Chongqing, China (2006.10.22-2006.10.26)] 2006 International Conference on Power System Technology - Effects of the Quality Factor of reactor on the TCSC characteristics and the Dual Impedance Solution Phenomenon
Sun, Hai-shun, Cheng, Shijie, Jiang, Lin, Zhao, Jianguo, Ma, Jia, Wen, JinyuYear:
2006
Language:
english
DOI:
10.1109/icpst.2006.321904
File:
PDF, 7.92 MB
english, 2006