Ion beam analysis of Li diffused Ge–Li interfaces

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films 1992 / 7 Vol. 10; Iss. 4

Ion beam analysis of Li diffused Ge–Li interfaces

Jen, Causon K. C.
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Volume:
10
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.577919
Date:
July, 1992
File:
PDF, 794 KB
english, 1992
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