[IEEE IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science - Monterey, CA, USA (2005.06.20-2005.06.23)] IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science - Characteristics of the Plasma Impedance Probe with Applied DC Bias
Blackwell, David D., Messer, Sarah J., Walker, David N., Amatucci, William E.Year:
2005
Language:
english
DOI:
10.1109/plasma.2005.359501
File:
PDF, 806 KB
english, 2005