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A High Resolution Wire Scanner Beam Profile Monitor with a Microprocessor Data Acquisition System
Cutler, R. I., Mohr, D. L., Whittaker, J. K., Yoder, N. R.Volume:
30
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.1983.4332765
Date:
August, 1983
File:
PDF, 1.14 MB
english, 1983