[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Cost-effective decap selection for beyond die power integrity
Chen, Yi-En, Tsai, Tu-Hsiung, Chen, Shi-Hao, Chen, Hung-MingYear:
2014
Language:
english
DOI:
10.7873/date.2014.059
File:
PDF, 1.85 MB
english, 2014