Rapid-thermal-annealing effect on lateral charge loss in...

Applied Physics Letters 2003 Vol. 82; Iss. 15

Rapid-thermal-annealing effect on lateral charge loss in metal–oxide–semiconductor capacitors with Ge nanocrystals

Kim, Jae Kwon, Cheong, Hea Jeong, Kim, Yong, Yi, Jae-Yel, Bark, Hong Jun, Bang, S. H., Cho, J. H.
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Volume:
82
Year:
2003
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.1567039
File:
PDF, 518 KB
english, 2003
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