[IEEE 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Hyderabad, India (2006.01.3-2006.01.7)] 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06) - Testing high-speed IO links using on-die circuitry
Iyer, P., Jain, S., Casper, B., Howard, J.Year:
2006
Language:
english
DOI:
10.1109/vlsid.2006.159
File:
PDF, 961 KB
english, 2006