High-resolution transmission electron microscopy study of...

High-resolution transmission electron microscopy study of the interfaces and stacking defects in superconducting/magnetic perovskite superlattices

Haberkorn, N., Lovey, F., Condó, A. M., Guimpel, J.
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Volume:
97
Year:
2005
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1858059
File:
PDF, 1.11 MB
english, 2005
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