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Note: A simple charge neutralization method for measuring the secondary electron yield of insulators
Weng, Ming, Cao, Meng, Zhao, Hong-Juan, Zhang, Hai-BoVolume:
85
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.4869139
Date:
March, 2014
File:
PDF, 726 KB
english, 2014