New photothermal deflection method for thermal diffusivity...

New photothermal deflection method for thermal diffusivity measurement of semiconductor wafers

Bertolotti, M., Dorogan, V., Liakhou, G., Li Voti, R., Paoloni, S., Sibilia, C.
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Volume:
68
Year:
1997
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1147589
File:
PDF, 459 KB
english, 1997
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