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[IEEE 2012 IEEE Photonics Conference (IPC) - Burlingame, CA, USA (2012.09.23-2012.09.27)] IEEE Photonics Conference 2012 - Sub-wavelength diffraction losses in a silicon nano-patterned membrane reflector
Rakhmanov, Malik, Miller, Travis D., Gribovskiy, Anton, Frost, Benjamin, Chuwongin, Santhad, Zhao, Deyin, Zhou, WeidongYear:
2012
Language:
english
DOI:
10.1109/ipcon.2012.6359298
File:
PDF, 408 KB
english, 2012