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Probing ultrathin film continuity and interface abruptness with x-ray photoelectron spectroscopy and low-energy ion scattering
Zhang, Wenyu, Nahm, Rambert K., Ma, Paul F., Engstrom, James R.Volume:
31
Year:
2013
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.4812695
File:
PDF, 2.27 MB
english, 2013