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Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures
Kury, P., Zahl, P., Horn-von Hoegen, M., Voges, C., Frischat, H., Günter, H.-L., Pfnür, H., Henzler, M.Volume:
75
Year:
2004
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1807003
File:
PDF, 1.25 MB
english, 2004