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[IEEE 2008 IEEE Instrumentation and Measurement Technology Conference - I2MTC 2008 - Victoria, BC, Canada (2008.05.12-2008.05.15)] 2008 IEEE Instrumentation and Measurement Technology Conference - A system for the characterization of piezoelectric bimorphs as sensors
Ando, Bruno, Giannone, Pietro, Graziani, SalvatoreYear:
2008
Language:
english
DOI:
10.1109/imtc.2008.4547027
File:
PDF, 3.61 MB
english, 2008