Electrical characterization and physical analysis of...

Journal of Applied Physics 1996 / 07 Vol. 80; Iss. 2

Electrical characterization and physical analysis of epitaxial CoSi2 grown from the Si〈100〉/Ti/Co system

Hatzikonstantinidou, Sofia, Wikman, Peter, Zhang, Shi‐Li, Sture Petersson, C.
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Volume:
80
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.362907
Date:
July, 1996
File:
PDF, 522 KB
english, 1996
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