Reexamination of SRAM Cell Write Margin Definitions in View...

IEEE Transactions on Circuits and Systems II: Express Briefs 2011 / 04 Vol. 58; Iss. 4

Reexamination of SRAM Cell Write Margin Definitions in View of Predicting the Distribution

Makino, Hiroshi, Nakata, Shunji, Suzuki, Hirotsugu, Mutoh, Shin'ichiro, Miyama, Masayuki, Yoshimura, Tsutomu, Iwade, Shuhei, Matsuda, Yoshio
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Volume:
58
Language:
english
Journal:
IEEE Transactions on Circuits and Systems II: Express Briefs
DOI:
10.1109/tcsii.2011.2124531
Date:
April, 2011
File:
PDF, 529 KB
english, 2011
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