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[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Influence of parasitic capacitances in modeling and analysis of advanced floating gate memory devices
Moreira, Andre, da Silva, Jose Machado, Tao, GuoquiaoYear:
2009
Language:
english
DOI:
10.1109/ipfa.2009.5232645
File:
PDF, 7.04 MB
english, 2009