Insulator photocurrents: application to dose rate hardening...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Insulator photocurrents: application to dose rate hardening of CMOS/SOI integrated circuits

Dupont-Nivet, E., Cole, Y.M., Flament, O., Tinel, F.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685216
Date:
June, 1998
File:
PDF, 759 KB
english, 1998
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