[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - IEEE 1500 utilization in SOC design and test
Zorian, Y., Yessayan, A.Year:
2005
Language:
english
DOI:
10.1109/test.2005.1584015
File:
PDF, 164 KB
english, 2005