![](/img/cover-not-exists.png)
[IEEE 1998 Bipolar/BiCMOS Circuits and Technology Meeting - Minneapolis, MN, USA (27-29 Sept. 1998)] Proceedings of the 1998 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.98CH36198) - Analysis of a Zener-triggered bipolar ESD structure in a BiCMOS technology
Coffing, D., Ida, R.Year:
1998
Language:
english
DOI:
10.1109/bipol.1998.741874
File:
PDF, 329 KB
english, 1998