High Frequency LIMM - A Powerful Tool for Ferroelectric Thin Film Characterization
Sandner, T., Suchaneck, G., Koehler, R., Suchaneck, A., Gerlach, G.Volume:
46
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580215380
Date:
January, 2002
File:
PDF, 552 KB
english, 2002