Implications of BTI-Induced Time-Dependent Statistics on...

IEEE Transactions on Electron Devices 2014 / 03 Vol. 61; Iss. 3

Implications of BTI-Induced Time-Dependent Statistics on Yield Estimation of Digital Circuits

Weckx, Pieter, Kaczer, Ben, Toledano-Luque, Maria, Raghavan, Praveen, Franco, Jacopo, Roussel, Philippe J., Groeseneken, Guido, Catthoor, Francky
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2296358
Date:
March, 2014
File:
PDF, 943 KB
english, 2014
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