Influence of grain size on the transport properties of Ni/sub 80/Fe/sub 20/ and Cu thin films
Rijks, T.G.S.M., Sour, R.L.H., Neerinck, D.G., De Veirman, A.E.M., Coehoorn, R., Kools, J.C.S., Gillies, M.F., de Jonge, W.J.M.Volume:
31
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/20.489798
Date:
January, 1995
File:
PDF, 327 KB
english, 1995