![](/img/cover-not-exists.png)
[IEEE 2008 IEEE Symposium on Computers and Communications (ISCC) - Marrakech (2008.07.6-2008.07.9)] 2008 IEEE Symposium on Computers and Communications - Metrics applied to Aspect Oriented Design using UML profiles
Debnath, N., Baigorria, L., Riesco, D., Montejano, G.Year:
2008
Language:
english
DOI:
10.1109/iscc.2008.4625764
File:
PDF, 505 KB
english, 2008