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Effect of interlayer trapping and detrapping on the determination of interface state densities on high-k dielectric stacks
Castán, H., Dueñas, S., García, H., Gómez, A., Bailón, L., Toledano-Luque, M., del Prado, A., Mártil, I., González-Díaz, G.Volume:
107
Year:
2010
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3391181
File:
PDF, 604 KB
english, 2010