[IEEE 2014 IEEE International Conference on Robotics and Automation (ICRA) - Hong Kong, China (2014.5.31-2014.6.7)] 2014 IEEE International Conference on Robotics and Automation (ICRA) - Calibration of scanning electron microscope using a multi-image non-linear minimization process
Cui, Le, Marchand, EricYear:
2014
Language:
english
DOI:
10.1109/icra.2014.6907621
File:
PDF, 494 KB
english, 2014