[IEEE 2014 IEEE Custom Integrated Circuits Conference - CICC 2014 - San Jose, CA, USA (2014.9.15-2014.9.17)] Proceedings of the IEEE 2014 Custom Integrated Circuits Conference - High linearity PVT tolerant 100MS/s rail-to-rail ADC driver with built-in sampler in 65nm CMOS
Palani, Rakesh Kumar, Harjani, RameshYear:
2014
Language:
english
DOI:
10.1109/cicc.2014.6946065
File:
PDF, 265 KB
english, 2014