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Analysis of the GaN-rich side of GaNP using x-ray diffraction
Tsuda, Yuhzoh, Mouri, Hirokazu, Araki, Masahiro, Yuasa, Takayuki, Taneya, MototakaVolume:
96
Year:
2004
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1812601
File:
PDF, 403 KB
english, 2004