Graphene-based sample supports for in situ...

Journal of Physics D Applied Physics 2011 / 02 Vol. 44; Iss. 5

Graphene-based sample supports for in situ high-resolution TEM electrical investigations

Westenfelder, B, Meyer, J C, Biskupek, J, Algara-Siller, G, Lechner, L G, Kusterer, J, Kaiser, U, Krill, C E, Kohn, E, Scholz, F
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Volume:
44
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/44/5/055502
Date:
February, 2011
File:
PDF, 1.47 MB
english, 2011
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