[IEEE 2007 Proceedings 57th Electronic Components and Technology Conference - Sparks, NV, USA (2007.05.29-2007.06.1)] 2007 Proceedings 57th Electronic Components and Technology Conference - RF Characterisation and Process Control for Passive Integration Components
van der Wel, P.J., Dijkhuis, J. F., Chanlo, C., Dolle, H.K.J. ten, van den Oever, L.C.M., Havens, R.J.Year:
2007
Language:
english
DOI:
10.1109/ectc.2007.374050
File:
PDF, 3.40 MB
english, 2007