[IEEE 2012 IEEE Energy Conversion Congress and Exposition (ECCE) - Raleigh, NC, USA (2012.09.15-2012.09.20)] 2012 IEEE Energy Conversion Congress and Exposition (ECCE) - Impact of the source-path parasitic inductance on the MOSFET commutations
Gaito, Antonino, Scollo, Rosario, Panebianco, Giuseppe, Raciti, AngeloYear:
2012
Language:
english
DOI:
10.1109/ecce.2012.6342656
File:
PDF, 1.89 MB
english, 2012