In situ characterization of GaN quantum dot growth with...

In situ characterization of GaN quantum dot growth with reflection high-energy electron diffraction and line-of-sight mass spectrometry

Brown, Jay S., Koblmüller, Gregor, Averbeck, Robert, Riechert, Henning, Speck, James S.
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Volume:
99
Year:
2006
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.2206375
File:
PDF, 785 KB
english, 2006
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