Raman measurement of vertical conductivity and localization...

Journal of Applied Physics 2000 Vol. 87; Iss. 4

Raman measurement of vertical conductivity and localization effects in strongly coupled semiconductor periodical structures

Pusep, Yu. A., Silva, M. T. O., Galzerani, J. C., Rodrigues, S. C. P., Scolfaro, L. M. R., Lima, A. P., Quivy, A. A., Leite, J. R., Moshegov, N. T., Basmaji, P.
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Volume:
87
Year:
2000
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.372097
File:
PDF, 362 KB
english, 2000
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