SFM characterization of SrBi 2...

Integrated Ferroelectrics 1999 / 11 Vol. 27; Iss. 1-4

SFM characterization of SrBi 2 Ta 2 O 9 thin films for nanoscale memory applications

Gruverman, A., Hironaka, K., Ikeda, Y., Satyalakshmi, K. M., Pignolet, A., Alexe, M., Zakharov, N. D., Hesse, D.
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Volume:
27
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584589908228465
Date:
November, 1999
File:
PDF, 1.42 MB
english, 1999
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