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[IEEE IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - Paris, France (2006.11.6-2006.11.10)] IECON 2006 - 32nd Annual Conference on IEEE Industrial Electronics - X-Ray Computed Tomography for Metals Using Fourier Reconstruction
Mantala, Chawanakorn, Theera-Umpon, NiponYear:
2006
Language:
english
DOI:
10.1109/iecon.2006.348069
File:
PDF, 1.49 MB
english, 2006