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[IEEE 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - College Station, TX, USA (2014.8.3-2014.8.6)] 2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS) - Post-silicon tuning aware wafer matching algorithm for 3d integration of ICs
Park, Sangdo, Kim, TaewhanYear:
2014
Language:
english
DOI:
10.1109/mwscas.2014.6908464
File:
PDF, 404 KB
english, 2014