[IEEE 2010 IEEE International Electron Devices Meeting...

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[IEEE 2010 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2010.12.6-2010.12.8)] 2010 International Electron Devices Meeting - A leading-edge 0.9µm pixel CMOS image sensor technology with backside illumination: Future challenges for pixel scaling

Wuu, S.G., Wang, C.C., Hseih, B.C., Tu, Y.L., Tseng, C.H., Hsu, T.H., Hsiao, R.S., Takahashi, S., Lin, R.J., Tsai, C.S., Chao, Y.P., Chou, K.Y., Chou, P.S., Tu, H.Y., Hsueh, F. L., Tran, L.
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Year:
2010
Language:
english
DOI:
10.1109/iedm.2010.5703358
File:
PDF, 552 KB
english, 2010
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