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Erratum: “Frequency noise in frequency modulation atomic force microscopy” [Rev. Sci. Instrum. 80, 043708 (2009)]
Kobayashi, Kei, Yamada, Hirofumi, Matsushige, KazumiVolume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3509402
File:
PDF, 313 KB
english, 2010