A study on the capacitance–voltage characteristics of...

A study on the capacitance–voltage characteristics of metal-Ta[sub 2]O[sub 5]-silicon capacitors for very large scale integration metal-oxide-semiconductor gate oxide applications

Chih-ming Lai, Benjamin, Kung, Nan-hui, Ya-min Lee, Joseph
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Volume:
85
Year:
1999
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.370315
File:
PDF, 358 KB
english, 1999
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