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[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Tozeur, Tunisia (2008.03.25-2008.03.27)] 2008 3rd International Conference on Design and Technology of Integrated Systems in Nanoscale Era - Accurate analysis of RF noise characteristics in active MOSFET Mixers in 90 nm technology
Fathi, Davood, Masoumi, NasserYear:
2008
Language:
english
DOI:
10.1109/dtis.2008.4540223
File:
PDF, 235 KB
english, 2008