Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope
Sader, John E., Sanelli, Julian, Hughes, Barry D., Monty, Jason P., Bieske, Evan J.Volume:
82
Year:
2011
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3632122
File:
PDF, 849 KB
english, 2011