The microstructure and electrical properties of contacts...

The microstructure and electrical properties of contacts formed in the Ni/Al/Si system due to rapid thermal processing

Katz, A., Komem, Y.
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Volume:
63
Year:
1988
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.340329
File:
PDF, 1.21 MB
english, 1988
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