Compact stand-alone atomic force microscope

Review of Scientific Instruments 1993 Vol. 64; Iss. 10

Compact stand-alone atomic force microscope

van der Werf, Kees. O., Putman, Constant A. J., de Grooth, Bart G., Segerink, Frans B., Schipper, Eric H., van Hulst, Niek F., Greve, Jan
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Volume:
64
Year:
1993
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1144378
File:
PDF, 1.17 MB
english, 1993
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