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[IEEE 2008 IEEE Custom Integrated Circuits Conference - CICC 2008 - San Jose, CA, USA (2008.09.21-2008.09.24)] 2008 IEEE Custom Integrated Circuits Conference - An array-based test circuit for fully automated gate dielectric breakdown characterization
Keane, John, Venkatraman, Shrinivas, Butzen, Paulo, Kim, Chris H.Year:
2008
Language:
english
DOI:
10.1109/cicc.2008.4672036
File:
PDF, 678 KB
english, 2008