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[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Characterization of the V/sub T/-instability in SiO/sub 2//HfO/sub 2/ gate dielectrics
Kerber, A., Cartier, E., Pantisano, L., Rosmeulen, M., Degraeve, R., Kauerauf, T., Groeseneken, G., Maes, H.E., Schwalke, U.Year:
2003
Language:
english
DOI:
10.1109/relphy.2003.1197718
File:
PDF, 329 KB
english, 2003