Atomic force microscope with improved scan accuracy, scan...

Review of Scientific Instruments 2003 Vol. 74; Iss. 10

Atomic force microscope with improved scan accuracy, scan speed, and optical vision

Kwon, Joonhyung, Hong, Jaewan, Kim, Yong-Seok, Lee, Dong-Youn, Lee, Kyumin, Lee, Sang-min, Park, Sang-il
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Volume:
74
Year:
2003
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.1610782
File:
PDF, 772 KB
english, 2003
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