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Microwave atomic force microscopy imaging for nanometer-scale electrical property characterization
Zhang, Lan, Ju, Yang, Hosoi, Atsushi, Fujimoto, AkifumiVolume:
81
Year:
2010
Language:
english
Journal:
Review of Scientific Instruments
DOI:
10.1063/1.3525058
File:
PDF, 679 KB
english, 2010