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[IEEE 2010 Chinese Conference on Pattern Recognition (CCPR) - Chongqing, China (2010.10.21-2010.10.23)] 2010 Chinese Conference on Pattern Recognition (CCPR) - Wavelet-Based Multi-Level Image Matching with Detail Measure Weight for Face Recognition under Varying Illumination
Chen, Hengxin, Tang, Yuan Yan, Fang, Bin, Zhang, TaipingYear:
2010
Language:
english
DOI:
10.1109/ccpr.2010.5659269
File:
PDF, 397 KB
english, 2010