![](/img/cover-not-exists.png)
[IEEE 2010 10th IEEE International Conference on Solid Dielectrics (ICSD) - Potsdam, Germany (2010.07.4-2010.07.9)] 2010 10th IEEE International Conference on Solid Dielectrics - A simulation of deep dielectric charging induced by dielectric temperature and energetic electrons
Li, Shengtao, Min, Daomin, Lin, Min, Li, Weiwei, Li, JianyingYear:
2010
Language:
english
DOI:
10.1109/icsd.2010.5568065
File:
PDF, 127 KB
english, 2010