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Analysis of stresses in Ru thin films prepared by chemical vapor deposition
Lim, Ha Jin, Kang, Sang Yeol, Hwang, Cheol Seong, Kim, Hyeong JoonVolume:
21
Year:
2003
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1560713
File:
PDF, 588 KB
english, 2003