Analysis of stresses in Ru thin films prepared by chemical...

Analysis of stresses in Ru thin films prepared by chemical vapor deposition

Lim, Ha Jin, Kang, Sang Yeol, Hwang, Cheol Seong, Kim, Hyeong Joon
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Volume:
21
Year:
2003
Language:
english
Journal:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
DOI:
10.1116/1.1560713
File:
PDF, 588 KB
english, 2003
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